tJuly 2001ConfidentialPage 1J750 RFID Option J750无线射频识别选件tJuly 2001ConfidentialPage 2INTEGRA J750 Target Markets J750的目标市场PRICE PER PIN PRICE PER PIN 价格价格PERFORMANCE PERFORMANCE 性能性能High PerformanceCISC Processor CISC ProcessorHigh IntegrationHigh VolumeRISC Processor RISC Processor8-bit Controller 8-bit Controller16/32-bit Controller 16/32-bit ControllerDSPsDSPsEmbedded Embedded ControllersControllersGate Arrays Gate ArraysPLDsPLDs/ /FPGAsFPGAsModems ModemsGraphics GraphicsAudio/Video Audio/VideoChipsets ChipsetsStorage StorageSmart CardstJuly 2001ConfidentialPage 3SmartCard / Chipcard 智能卡/芯片卡 Typical Applications 典型应用: Identification 身份证 Access Control 门禁 控制 Banking 银行 Telephone Cards 电 话卡 Low pin count (2-5 I/O pins, VDD, GND) Low frequency (2MHz-15MHz) Only waferprobe, no package test 32 sites parallel test is mandatory.tJuly 2001ConfidentialPage 4RFID Cards 无线射频识别卡 Typical Applications 典型应用: Identification 身份证 Access Control 门禁控 制 TAGs/Labels 标签 Public transportation 公 共交通 Retail chain supply 零 售店 Logistic 快递 (e.g. UPS, Fedex, DHL) Airline baggage tracking 行李牌 Frequency Range: 125kHz-134kHz, 13.56MHz 2 device pins (antenna interface) 2-4 pins added for testability, plus VDD + GND)tJuly 2001ConfidentialPage 5SMART CARD (eg.for banks)micro- controllerserial interfaceAC/DCRF interfaceencrypt decryptprotocolEEPROMRAMOTPROMAC/DCRF interfaceserial numberprotocolTAG(eg.for price labeling)laminate sheetlaminate sheetinlet sheetchipantennahousingchipWide range ofapplicationsAnimal identificationantennaRFID Device TypestJuly 2001ConfidentialPage 6RFID Target ApplicationsComplexity只读应答器 Read-Only Transponder 0chip cardchip cardchip cardchip cardchip cardCard readerR=0tJuly 2001ConfidentialPage 29URCLDUT+1-1AD converterPer cycle demodSync UnitJ750digitalChannel electronicsRECEIVERTRANSMITTERCommunication DUT-TesterCURRENT SENSING 电流采样Capture MemoryDiff. AmptJuly 2001ConfidentialPage 30DUTURCL+1-1AD converterPer cycle demodSync UnitRECEIVERTRANSMITTERVOLTAGE SENSING 电压采样Capture MemoryDiff. Amp.J750digitalChannel electronicsCommunication DUT-TestertJuly 2001ConfidentialPage 31Alternate RFID Levels for emulating over-undershoots of the reader，调整RFID电平仿真读卡机的过冲和欠冲tJuly 2001ConfidentialPage 32Ramping up of RFID carrier prior to functional testing，RFID载波的幅度调制Computer controlled steps20 mV to 16VtJuly 2001ConfidentialPage 33RRCCAC/DC CouplingAC/DC CouplingResistor Coupling20 50 500 5K High LowAltLowAltHighHigh LowAltLowAltHighPattern ControlPattern ControlCarrier Frequency SourcePinHiPinLoChHiChLoDUT ConnectDC tests on antenna pins 在天线管脚上的直流测试tJuly 2001ConfidentialPage 34Key Requirement: Parallel Test Currently, 32 sites in parallel is state-of-the-art Due to die sizes below 1mm2 a 12” wafer could have over 70.000 RFID dies Strong need for 128/256 sites parallel test Current probecard technology allows high site counts at reasonable costs16 dies8 dies.tJuly 2001ConfidentialPage 35Modular Configuration Options 模块化的配置选件512-pin system 32 device power supplies 2 RFID Option Board (32 channels) 256 digital channels 1 Converter Test Option 2 Mixed Signal Option64 Pin Digital Channel BoardDevice PowerSupplies64 Pin Digital Channel BoardMixed Signal OptionMixed Signal OptionSuppliesDevice Power SuppliesDevice Power SuppliesDevice Power SuppliesDevice Power SuppliesConverter Test OptionRFID Option Board (16 channels)64 Pin Digital Channel Board 64 Pin Digital Channel Board RFID Option Board (16 channels)tJuly 2001ConfidentialPage 36How does the RFID option improve economics of device testing? Complete functional test capability through 2 device pins for tag ICs. Synchronization of device responses to achieve true parallel test. Testing in parallel up to 32 sites. Fast LVM modify for device personalization. Capacitance measurement. Analog Capture capability for device response analysis.tJuly 2001ConfidentialPage 37RFID Option - Key Features 主要特性 Bi-directional RF Communication 双向射频通讯 Amplitude modulated RFID floating source with up to 32Vpp and frequencies from 10kHz to 15 Mhz 调幅RFID信号源：10kHz15MHz频率，幅度可达32V峰峰值 Per-Channel analog waveform capture capability for device response analysis 开捕获每通道模拟波形用于器件响应分析 Capacitance measurement for process control 电容测量能力用于工艺分析 Synchronizes device responses of up to 32 devices 同步测试32路器件响应 High Level Programming and debug tools 高层编程和调试工具 Focused on production throughput 针对高生产效率而设计