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二极管齐纳安全栅电路的设计与分析 61,Y2,2(1.g+0K,rK19=5,E!9HCp,/TI。ms|TM02DSMAcI|1004-9118(2011)02-0025-03Analysis and Design of Electric Circuits on Zener Diode Safety BarrierCHEN Ze-wen1, WANG De-fang2, LIU Ya2(1.Shenzhen Extra Safe Electronics Co., Ltd., Shenzhen Guangdong 518057;2.Nanyang Explosion Protected Electrical Apparatus Research Institute, Nanyang Henan 473008)Key words:diode safety barrier;intrinsically safe associated device;infallible component;count-able fault;non-countable fault;double protection;component failureAbstract :In this paper, it sum up the common faults arisen in design of zener diode safety barriercircuit and it is valuable reference for the technician with less experience in intrinsically safe.0!BT,|!=.ILV?3r?K?3。/e、,+Yal|B,NVrT(7、,kvWiE。Kf7。,=5D1i,iBC7(?,Y。7KTER1F1rKHq。yN,Mq1?,iB?VLMH,6B?M?。m4U,L=iP。y:GB 3836.42010I4s:“i”!7.3H8.4HKE?:?KEC7#p,i9#p。LSNH,E(1)A1。m4=5m2=5,Eq4Y,ET$9FK、Kq,5?Y。K、KqL?3YHME。2.1=)54Tn54,=)5Vz,EK7。NHIns(YF10%Km)。9TH,T/l-2 3。2.2KE4KEE,Ev,?Y9v,EKl4|%aV8)Y-A、B、C。YVVKvImKlKEER2。i:41.5,R2=1.5Vz Im。2.34Y,-250 VKf/CK;26=5,E!9s2011,2中国电器工业协会防爆电机分会二届三次会员大会圆满召开Sxs=Qv2011M59 12Z28gz7,7295VFp。510,vHz7,sySpi7M,5VFpVU。SxT1,sT,isT41pin。.rSx=Qp*、S“E=”in9fT*,SEZ#s1p。yp8vB?vSz,SE?h3SD。sY*S1,s=Qv$s,9“E=”W?ZZ,i4ZFy!Z41p,QvSBq1ilvY。4T?S,:zSEZ,4K。2、sY+TsYT,sTT$,9s+M:91p,4,4?Z?ZST,?7?Z、SZ|。4F?S、Fy?Z,S6?Z1slJ3。4#BSzT。8zmT、G,SY?Zmy,isz+ZT4yp。,sY5SE?Lf,Sx?Z&NT1il、TT=1p。pWV)“E=”in、3V%5(s)SESGB3836.14s。vEY5Sxx【2011】033|17ZNTYSE?M1。,vE:LSESGB186132006Lf,)YB2_YB3VM1YR,iOBiYV/BNB,YB3MsN。Ng.,rm,SE?S,w。V,sT4zyp。71|LSE?SVj,VYB3yw,N)irBM。-1.51.7In;
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