文件修订记录文件日 期修订描 述版本页次1.0 2011-06-14全部新制定目录1、计划名称（ Theme） .32、计划目标（ Purpose）33、各流程质量控制点的要求（Requirements of quality control procedures）34、质量计划实施过程中的关注要点（Key points while implementing the Quality Control Plan ）31、计划名称（ Theme）：保障订单的生产和交付。2、计划目标（ Purpose）：按照客户提出的需求，生产满足需求的产品。3、各流程质量控制点的要求（Requirements of quality control procedures）：（详见下页）4、质量计划实施过程中的关注要点（ Key points while implementing the Quality Control Plan）：4.1 在计划实施过程中要应用 SPC 等质量统计方法，确保生产过程处于受控状态。 （Our company should use Quality statistical methods such as SPC to ensure that the production process is under control.）4.2 严格按照文件的要求进行生产、监视测量的控制，要把控制目标落实到责任部门、责任人员。（Our company should strictly based on the requirement of the Documents to product and monitor the measurement. The quality objects should be fulfilled by responsible departments and persons）.4.3 当生产过程出现超过控制范围时，各子公司质量部门的PQC 要开具纠正预防措施单提交相关责任部门（责任人），并跟踪验证整改结果。（When the production process is out of control, the PQC of Quality Management Department should submit the corrective and preventive action to the Responsible departments and persons and trace the improvement later ）on.4.4 产品发货时，质量部门要安排人员按合同要求进行验证，确认产品能满足客户的要求后方能放行。（Before delivering the products , Quality Management Department should inspect the products according to the contact, make sure that the products can meet the customers requirements.）工序控制步骤硅片硅片检验电池片制电池程及 Cpk 控制电池片终电池测控制内容CSUN 文件责任部门硅片外观硅片厚度硅片长宽度TTV切痕硅片接收和检验标准NPV质量管理部弯曲度导电类型少子寿命电阻率制绒腐蚀重量制绒后的反射率生产部扩散后方块电阻及片内极差质量管理部扩散后少子寿命晶体硅太阳电池过程检验规格限及校工艺部刻蚀后腐蚀重量及边缘电阻NPV整合部准、测试频次标准刻蚀后测试点方块电阻及片内极差镀膜后膜厚、折射率、反射率（片内颜色的均匀性）镀膜后少子寿命印刷栅线的控制电池片效率分档测试成品电池片外观判检标准成品部电池片外观检验 CSUN 晶体硅电池包装技术要求NPV质量管理部电池片在线测试光强的校准测试台校准规程物流部电池电池片的温度系数P 型晶体硅太阳电池可靠性测试组件所用辅材检验及可靠性测试组件电池组件的制程电池组件的最终测试光致衰减CSUN研发中心电极可焊性NPV质量管理部电极附着强度太阳能电池组件用 EVA 质量检验规范太阳能电池组件用助焊剂检验规范太阳能电池组件包装纸箱检验规范太阳能电池组件背板标签检验规范背板材料、钢化玻璃、硅胶、接线盒、铝边框、涂太阳能电池组件背板材料检验规范SST质量管理部锡铜带、助焊剂、 EVA 、助焊剂、背板标签太阳能电池组件钢化玻璃检验规范技术部太阳能电池组件用硅胶检验规范太阳能电池组件用接线盒检验规范太阳能电池组件用铝边框检验规范太阳能电池组件用涂锡铜带检验规范及辅材可靠性试验规程生产部分选、单焊、串焊、叠层、层压、组框组件在线生产质量控制要求SST技术部质量管理部电池组件功率测试电池组件外观检验晶体硅太阳电池组件检验规范SST质量管理部ProceduresControl StepsItemsCSUN DocumentsResponsible DepartmentsWaferWafer inspectionVisual inspection of wafersWafer inspection and acceptionNPVQuality ManagementSolar cellproductionprocess and CpkcontrolSolar cellsThickness of wafersDimensions of wafersTTVSaw marksWarpageConductivity typeLifetimeResistivityWafer weight after texturing Reflectivity after texturingSquare resistance and the range within the wafer after diffusionLifetime after diffusionWafer weight and edge resistance after edge isolationSquare resistance and the range within the wafer after edge isolationFilm thickness, refractivity, after PECVDLifetime after PECVD Control of finger printingcriterionCrystalline silicon solar cell production process inspectionNPVspecification limits and calibration, test frequency standardsDepartmentProduction DepartmentQuality ManagementDepartment Technology CenterCombinedDepartmentFinal Tests ofsolar cellsVisual inspection criterion of solarI-V Testing and Sorting of solar cellscellsNPVPakaging requirements of solar cellsVisual inspection of solar cellsin CSUNFinished productManagement DepartmentQuality Management DepartmentTester CalibrationTemperature Co efficiencyReliability testsLIDof solar cellsSolder ability of busbarsAdhesive strength of busbarsAuxiliarybackboard materials、re